Ключевые слова: HTS, Bi2223, nanodoping, nanoscaled effects, nanoparticles, bulk, fabrication, X-ray diffraction, lattice parameter, grain size, critical temperature, microstructure, magnetization, temperature dependence, hysteresis, critical caracteristics, Jc/B curves, irreversibility fields, pinning force, experimental results
Ключевые слова: Bi2212, substitution, bulk, sintering, fabrication, grain size, mechanical properties, strain effects, X-ray diffraction, lattice parameter, density, microstructure
Ключевые слова: HTS, Bi2212, thin films, nanodoping, nanoscaled effects, nanoparticles, fabrication, sol gel process, texture, X-ray diffraction, microstructure, grain size, resistivity, resistive transition, critical temperature, critical caracteristics, Jc/B curves, critical current density, composition, pinning force, temperature dependence, experimental results
Ключевые слова: LTS, Nb3Sn, wires, grain boundaries, grain size, nanoscaled effects, PIT process, pinning centers artificial, comparison, microstructure, pinning force, experimental results
Ключевые слова: HTS, bulk, YBCO, fabrication, infiltration process, phase composition, nanoscaled effects, microstructure, electron diffraction, grain size, experimental results
Holzapfel B., Hanisch J., Sailer B., Thoener M., Schlenga K., Abaecherli V., Kauffmann-Weiss S., Buehler C., Wanior M., Heilmaier M.
Ключевые слова: FCC, LTS, Nb3Sn, wires multifilamentary, fabrication, phase diagram, phase composition, bronze process, internal tin method, PIT process, composition, critical temperature, upper critical fields, doping effect, grain size, distribution, pinning, pinning force, microstructure, critical caracteristics, Jc/B curves, mechanical properties, strain effects, lattice parameter, stress effects, bending process, degradation studies, transverse stress
Ключевые слова: MgB2, bulk, fabrication, doping effect, critical caracteristics, Jc/B curves, grain size, microstructure, critical caracteristics, upper critical fields, irreversibility fields, pinning force, X-ray diffraction, lattice parameter, RRR parameter, microstructure, resistive transition, magnetic field dependence, experimental results
Murakami M., Sakai N., Oka T., Jirsa M., Muralidhar M., Rao M.S., TAKEMURA K., Sunsanee P., Srikanth A.S.
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